Abstract: The implementation of vertically stacked gate-all-around nanosheet FET (GAA NSFET) may help improve the performance of static random access memory (SRAM) for the design flexibility with ...
Abstract: Static random access memories (SRAMs) are prone to a single-event upset (SEU), also known as soft errors, due to transient noise caused by a single strike of radiation. Beam testing has been ...
The Croatian adaptation of young adult drama series “Skam,” whose second season received a special mention in the best TV series in Central and Eastern Europe category at the NEM Awards in Zagreb, has ...
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