Abstract: In semiconductor manufacturing, wafer defect recognition plays a critical role. As the technology advances and wafer feature sizes decrease, defect detection has become more challenging, ...
When a house catches on fire, we assume that a smoke alarm inside will serve one purpose and one purpose only: warn the ...
Ensembles of Deep Neural Networks for the Automatic Detection of Building Facade Defects From Images
Abstract: Preserving the value of buildings and ensuring performance levels within acceptable parameters throughout their lifespan necessitates constant monitoring. In recent years, artificial ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback